Authors

Xing, Guo; Hatchtel, Jordan; Linten, Dimitri; Mitard, Jerome; Witters, Liesbeth; Collaert, Nadine; Pantelides, Sokrates

ISSN

1530-4388

Issue

3

Journal

IEEE Transactions on Device and Materials Reliability

Volume

15

Title

Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs

Publication type

Journal article