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Activation energies for oxide- and interface-trap charge generation due to negative-bias--temperature stress of Si-capped SiGe-pMOSFETs
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1867 since deposited on 2021-10-23
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Acq. date: 2025-10-24
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Views
1867 since deposited on 2021-10-23
404item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations