Browsing by author "De Wit, Pieter J.H."

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Emerging yield and reliability challenges in nanometer CMOS technologies

Gielen, Georges; De Wit, Pieter J.H.; Maricau, Elie; Loeckx, J.; Martin-Martinez, Jose; Kaczer, Ben; Groeseneken, Guido; Rodriguez, Rosanna; Nafria, Montserrat (2008)