Emerging yield and reliability challenges in nanometer CMOS technologies

Thumbnail
View/open
Metadata
Show full item record
Authors
Gielen, Georges; De Wit, Pieter J.H.; Maricau, Elie; Loeckx, J.; Martin-Martinez, Jose; Kaczer, Ben; Groeseneken, Guido; Rodriguez, Rosanna; Nafria, Montserrat
Conference
Design Automation and Test in Europe Conference - DATE
Title
Emerging yield and reliability challenges in nanometer CMOS technologies
Publication type
Proceedings paper
Embargo date
9999-12-31
Collections