Publication:

Emerging yield and reliability challenges in nanometer CMOS technologies

Date

2008

Proceedings Paper

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Files

16755.pdf 336.51 KB

Author(s)

Gielen, Georges

;

De Wit, Pieter J.H.

;

;

;

Martin-Martinez, Jose

;

;

Groeseneken, Guido

;

Rodriguez, Rosanna

;

Nafria, Montserrat

Metrics

1918 since deposited on 2021-10-17

Acq. date: 2025-12-09