Browsing by author "van Langevelde, R."

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Modeling and characterization of noise in 90nm CMOS technology

Scholten, Andries; Tiemeijer, Luuk; Zegers-van Duijnhoven, A.T.A.; Havens, R.J.; de Kort, R.; van Langevelde, R.; Klaassen, Dick; Jeamsaksiri, Wutthinan; Velghe, R.D.M.A. (2005)