Modeling and characterization of noise in 90nm CMOS technology

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Authors
Scholten, Andries; Tiemeijer, Luuk; Zegers-van Duijnhoven, A.T.A.; Havens, R.J.; de Kort, R.; van Langevelde, R.; Klaassen, Dick; Jeamsaksiri, Wutthinan; Velghe, R.D.M.A.
Conference
Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF
Title
Modeling and characterization of noise in 90nm CMOS technology
Publication type
Proceedings paper
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