Publication:

Modeling and characterization of noise in 90nm CMOS technology

Date

2005

Proceedings Paper

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Author(s)

Scholten, Andries

;

Tiemeijer, Luuk

;

Zegers-van Duijnhoven, A.T.A.

;

;

;

van Langevelde, R.

;

;

Jeamsaksiri, Wutthinan

;

Velghe, R.D.M.A.

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Acq. date: 2026-02-26