Browsing by author "Srinivasan, Purushothaman"
Now showing items 1-8 of 8
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Channel length and oxide thickness scaling effects on low-frequency (1/f) noise in metal/high-k sub-micron MOSFETs
Srinivasan, Purushothaman; Simoen, Eddy; Claeys, Cor (2005) -
Effect of nitridation on l/f noise in n-MOSFETs with high-k dielectric
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Gate-dielectric interface effects in low frequency (1/f) noise in p-MOSFETs with high-K dielectrics
Srinivasan, Purushothaman; Simoen, Eddy; Singanamalla, Raghunath; Yu, HongYu; Claeys, Cor; Misra, D. (2005) -
Impact of gate material on low-frequency noise of n-MOSFETs with 1.5 nm SiON gate dielectric: testing the limits of the number fluctuations theory
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Impact of high-K gate stack material with metal gates on LF noise in n- and p MOSFETs
Srinivasan, Purushothaman; Simoen, Eddy; Pantisano, Luigi; Claeys, Cor; Misra, D. (2005) -
Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
Claeys, Cor; Simoen, Eddy; Srinivasan, Purushothaman; Misra, D. (2007) -
Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks
Srinivasan, Purushothaman; Crupi, F.; Simoen, Eddy; Magnone, P.; Pace, C.; Misra, D.; Claeys, Cor (2007) -
Mixed-signal and noise properties of nMOSFETs with HfSiON/TaN gate stacks
Rittersma, Chris; Simoen, Eddy; Srinivasan, Purushothaman; Vertregt, M.; Claeys, Cor (2005)