Browsing by author "Wallinga, H."
Now showing items 1-5 of 5
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Breakdown and recovery of thin gate oxides
Bearda, Twan; Mertens, Paul; Heyns, Marc; Woerlee, P.; Wallinga, H. (2000) -
Breakdown and recovery of thin gate oxides
Bearda, Twan; Mertens, Paul; Heyns, Marc; Wallinga, H.; Woerlee, P. (2000) -
Current-voltage characteristics of gate oxides after hard breakdown
Bearda, Twan; Woerlee, P. H.; Wallinga, H.; Mertens, Paul (2001) -
Modelling of crystal originated particles and their impact on gate oxide integrity
Bearda, Twan; Mertens, Paul; Woerlee, P. H.; Wallinga, H.; Schmolke, R.; Heyns, Marc (2002) -
Numerical analysis of electromigration in thin film VLSI interconnections
Petrescu, Violeta; Mouthaan, T.; Schoenmaker, Wim; Angelescu, Serban; Vissarion, R.; Dima, G.; Wallinga, H.; Profirescu, M. D. (1995)