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Breakdown and recovery of thin gate oxides
Publication:
Breakdown and recovery of thin gate oxides
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Date
2000
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bearda, Twan
;
Mertens, Paul
;
Heyns, Marc
;
Wallinga, H.
;
Woerlee, P.
Journal
Japanese Journal of Applied Physics. Part 2: Letters
Abstract
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1994
since deposited on 2021-10-14
1
last month
Acq. date: 2026-01-11
Citations
Metrics
Views
1994
since deposited on 2021-10-14
1
last month
Acq. date: 2026-01-11
Citations