Publication:

Breakdown and recovery of thin gate oxides

Date

2000
Journal article
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4068.pdf 74.94 KB

Author(s)

Bearda, Twan
;
Mertens, Paul  
;
Heyns, Marc  
;
Wallinga, H.
;
Woerlee, P.

Journal

Japanese Journal of Applied Physics. Part 2: Letters

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2001 since deposited on 2021-10-14
4last month
Acq. date: 2026-04-06

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2001 since deposited on 2021-10-14
4last month
Acq. date: 2026-04-06

Citations