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Breakdown and recovery of thin gate oxides
Publication:
Breakdown and recovery of thin gate oxides
Date
2000
Journal article
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4068.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bearda, Twan
;
Mertens, Paul
;
Heyns, Marc
;
Wallinga, H.
;
Woerlee, P.
Journal
Japanese Journal of Applied Physics. Part 2: Letters
Abstract
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1989
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1989
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations