Browsing by author "Serron, Jill"
Now showing items 1-8 of 8
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Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism
Serron, Jill; Minj, Albert; Spampinato, Valentina; Franquet, Alexis; Rybalchenko, Yevhenii; Boulon, Marie-Emmanuelle; Brems, Steven; Shi, Yuanyuan; Groven, Benjamin; Villarreal, Renan; Conard, Thierry; van der Heide, Paul; Hantschel, Thomas; Medina Silva, Henry (2023-05-17) -
Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
Spampinato, Valentina; Shi, Yuanyuan; Serron, Jill; Minj, Albert; Groven, Benjamin; Hantschel, Thomas; van der Heide, Paul; Franquet, Alexis (2023) -
Direct Assessment of Defective Regions in Monolayer MoS<sub>2</sub> Field-Effect Transistors through <i>In Situ</i> Scanning Probe Microscopy Measurements
Minj, Albert; Koladi Mootheri, Vivek; Banerjee, Sreetama; Nalin Mehta, Ankit; Serron, Jill; Hantschel, Thomas; Asselberghs, Inge; Goux, Ludovic; Kar, Gouri Sankar; Heyns, Marc; Lin, Dennis (2024) -
Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance Nanoelectronics
Shi, Yuanyuan; Groven, Benjamin; Serron, Jill; Wu, Xiangyu; Nalin Mehta, Ankit; Minj, Albert; Sergeant, Stefanie; Han, Han; Asselberghs, Inge; Lin, Dennis; Brems, Steven; Huyghebaert, Cedric; Morin, Pierre; Radu, Iuliana; Caymax, Matty (2021) -
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
Celano, Umberto; Lee, Y.; Serron, Jill; Smith, Cole; Franco, Jacopo; Ryu, K.; Kim, M.; Park, S.; Lee, J.; Kim, J.; van der Heide, Paul (2021) -
Mitigating Dark Current for High-Performance Near-Infrared Organic Photodiodes via Charge Blocking and Defect Passivation
Yang, Weitao; Qiu, Weiming; Georgitzikis, Epimitheas; Simoen, Eddy; Serron, Jill; Lee, Jiwon; Lieberman, Itai; Cheyns, David; Malinowski, Pawel; Genoe, Jan; Chen, Hongzheng; Heremans, Paul (2021) -
Surface contamination: A natural way towards high-resolution electric force microscopy in contact-resonant mode
Minj, Albert; Serron, Jill; Celano, Umberto; Paredis, Kristof (2020) -
The sapphire surface structure and its impact on MOCVD grown wafer-scale MoS2 uniformity and MOSFET variability
Shi, Yuanyuan; Groven, Benjamin; Serron, Jill; Han, Han; Banerjee, Sreetama; Wu, Xiangyu; Ludwig, Jonathan; Asselberghs, Inge; Lin, Dennis; Morin, Pierre; Caymax, Matty; Radu, Iuliana (2019)