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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
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Authors
Celano, Umberto
;
Lee, Y.
;
Serron, Jill
;
Smith, Cole
;
Franco, Jacopo
;
Ryu, K.
;
Kim, M.
;
Park, S.
;
Lee, J.
;
Kim, J.
;
van der Heide, Paul
DOI
10.1016/j.sse.2021.108136
ISSN
0038-1101
Issue
na
Journal
SOLID-STATE ELECTRONICS
Volume
185
Title
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides
Publication type
Journal article
Embargo date
2023-07-18
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2
20.500.12860/37420.2
*
2021-12-09T15:10:12Z
validation by library/open access desk
1
20.500.12860/37420
2021-11-02T15:54:52Z
*Selected version
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