Browsing by author "Celano, Umberto"
Now showing items 1-20 of 135
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3D-carrier profiling and parasitic resistance analysis in vertically stacked gate-all-around Si nanowire CMOS transistors
Eyben, Pierre; Ritzenthaler, Romain; De Keersgieter, An; Chiarella, Thomas; Veloso, Anabela; Mertens, Hans; Pena, Vanessa; Santoro, Gaetano; Machillot, Jerome; Kim, Myungsun; Miyashita, Toshihiko; Yoshida, Naomi; Bender, Hugo; Richard, Olivier; Celano, Umberto; Paredis, Kristof; Wouters, Lennaert; Mitard, Jerome; Horiguchi, Naoto (2019) -
A 3D electrical characterization of single stacking faults in InP by conductive-AFM
Mannarino, Manuel; Celano, Umberto; Lu, Augustin; Chintala, Ravi Chandra; Paredis, Kristof; Vandervorst, Wilfried (2015) -
A comprehensive variability study of doped HfO2 FeFET for memory applications
Ronchi, Nicolo; Ragnarsson, Lars-Ake; Celano, Umberto; Kaczer, Ben; Kaczmarek, Jakub; Banerjee, Kaustuv; McMitchell, Sean; Van den Bosch, Geert; Van Houdt, Jan (2022) -
Advanced characterization methods for HfO2/ZrO2-based ferroelectrics
Lomenzo, Patrick D. D.; Celano, Umberto; Kaempfe, Thomas; McMitchell, Sean (2023) -
Advantages of high vacuum for electrical scanning probe microscopy
Ludwig, Jonathan; Mascaro, Marco; Celano, Umberto; van der Heide, Paul; Vandervorst, Wilfried; Paredis, Kristof (2019) -
Advantages of high vacuum for electrical scanning probe microscopy
Ludwig, Jonathan; Mascaro, Marco; Celano, Umberto; Vandervorst, Wilfried; Paredis, Kristof (2019) -
All-nanocellulose nonvolatile resistive memory
Celano, Umberto; Nagashima, Kazuki; Hirotaka, Koga; Masaya, Nogi; Fuwei, Zhuge; Gang, Meng; Yong, He; De Boeck, Jo; Jurczak, Gosia; Vandervorst, Wilfried; Yanagida, Takeshi (2016) -
An innovative probe microscopy solution for measuring conductivity profiles in 3-dimensions
Celano, Umberto; Paredis, Kristof; Humphris, Andrew; Tedaldi, Matt; O'Sullivan, Connor Laharn; Hole, Patrick; Goulden, Jenny (2021) -
Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices
Belmonte, Attilio; Celano, Umberto; Redolfi, Augusto; Fantini, Andrea; Muller, Robert; Vandervorst, Wilfried; Houssa, Michel; Jurczak, Gosia; Goux, Ludovic (2015) -
Atomic force microscopy in the era of 3D nanoelectronic devices
Celano, Umberto (2016) -
Atomically-thin tunable zone plate lens
Van de Groep, Jorik; Song, Jung-Hwan; Celano, Umberto; Brongersma, Mark L. (2019) -
Carrier profiling in high vacuum using Scanning Spreading Resistance Microscopy and Scanning Capacitance Microscopy
Wouters, Lennaert; Minj, Albert; Celano, Umberto; Hantschel, Thomas; Paredis, Kristof; Vandervorst, Wilfried (2020) -
Carrier profiling with Fast Fourier transform scanning spreading resistance microscopy: A case study for Ge, GaAs, InGaAs, and InP
Dixon-Luinenburg, Oberon; Celano, Umberto; Vandervorst, Wilfried; Paredis, Kristof (2019) -
Carrier type dependence on spatial asymmetry of unipolar resistive switching of metal oxides
Nagashima, Kazuki; Yanagida, Takeshi; Kanai, Masaki; Celano, Umberto; Rahong, Sakon; Meng, Gang; Zhuge, Fuwei; He, Yong; Park, Bae Ho; Kawai, Tomoji (2013) -
Cellulose nanofiber paper as an ultra flexible nonvolatile memory
Nagashima, Kazuki; Koga, Hiroito; Celano, Umberto; Zhuge, Fuwei; Kanai, Masakai; Rahong, Sakon; Meng, Gang; He, Yong; De Boeck, Jo; Jurczak, Gosia; Vandervorst, Wilfried; Kitaoka, Takuya; Nogi, Masaya; Yanagida, Takeshi (2014) -
Cellulose nanofibers for resistive switching: toward a paper-based electronics
Celano, Umberto; Nagashima, Kazuki; Koga, Hirotaka; Nogi, Masaya; Suganuma, Katsuaki; De Boeck, Jo; Jurczak, Gosia; Vandervorst, Wilfried (2014) -
Characterization of grain boundaries and impact of plasma-induced patterned in 2D materials
Celano, Umberto; Virkki, Olli; Chiappe, Daniele; Heyne, Markus; Hoflijk, Ilse; Franquet, Alexis; Huyghebaert, Cedric; Paredis, Kristof; De Gendt, Stefan; Radu, Iuliana; Vandervorst, Wilfried (2017) -
Chasing plasmons in flatlands
Celano, Umberto; Maccaferri, Nicolo; Brittman, Sarah (2019) -
Circuit delay and power benchmark of graphene against Cu interconnects
Contino, Antonino; Ciofi, Ivan; Baert, Rogier; Wu, Xiangyu; Asselberghs, Inge; Celano, Umberto; Wilson, Chris; Tokei, Zsolt; Groeseneken, Guido; Soree, Bart (2019) -
Combined in-situ scanning force microscopy/TOFSIMS and FIB-TOFSIMS analysis: towards 3D chemical analysis
Conard, Thierry; Franquet, Alexis; Spampinato, Valentina; Op de Beeck, Jonathan; Celano, Umberto; Vandervorst, Wilfried; Moeler, Rudolf; Labyedh, Nouha; Vereecken, Philippe (2017)