Publication:

Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices

Date

2015

Journal article

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Files

30936.pdf 1.73 MB

Author(s)

Belmonte, Attilio

;

Celano, Umberto

;

Redolfi, Augusto

;

Fantini, Andrea

;

;

Vandervorst, Wilfried

;

;

;

Journal

IEEE Transactions on Electron Devices

Statistics

1934 since deposited on 2021-10-22

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Acq. date: 2026-04-05