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Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices
Publication:
Analysis of the excellent memory disturb characteristics of a hourglass-shaped filament in Al2O3/Cu-based CBRAM devices
Date
2015
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Belmonte, Attilio
;
Celano, Umberto
;
Redolfi, Augusto
;
Fantini, Andrea
;
Muller, Robert
;
Vandervorst, Wilfried
;
Houssa, Michel
;
Jurczak, Gosia
;
Goux, Ludovic
Journal
IEEE Transactions on Electron Devices
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1931
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Acq. date: 2025-10-24
Citations
Metrics
Views
1931
since deposited on 2021-10-22
416
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations