Browsing by author "Vandamme, Lorenz"
Now showing items 1-12 of 12
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Characterization of integrated resistors for broadband telecom printed circuit boards
Peeters, Joris; Ackaert, Ann; Vandamme, Lorenz; Allaert, K.; Botte, Marnix; Van Den Torren, Luc; Martens, Luc; De Zutter, Daniel (1996) -
Critical discussion on unified 1/f noise models for MOSFETs
Vandamme, Ewout; Vandamme, Lorenz (2000) -
Current crowding and its effect on 1/f noise and third harmonic distortion - a case study for quality
Vandamme, Ewout; Vandamme, Lorenz (2000) -
Diagnostics of the quality of MOSFETs
Vandamme, Ewout; Vandamme, Lorenz (1996) -
Impact of silicon substrate, iron contamination and perimeter on saturation current and noise in n+p diodes
Vandamme, Lorenz; Vandamme, Ewout; Dobbelsteen, J. J. (1997) -
Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines
Vandamme, Ewout; De Wolf, Ingrid; Lauwers, Anne; Vandamme, Lorenz (1998) -
Low frequency noise analysis as a diagnostic tool to assess the quality of 0.25 μm Ti-silicided poly-lines..
Vandamme, Ewout; De Wolf, Ingrid; Lauwers, Anne; Vandamme, Lorenz (1998) -
Mixed assembly of PCB using a novel flip-chip technology
Vanfleteren, Jan; Stoukatch, Serguei; Vandecasteele, Bjorn; Van Calster, Andre; Criel, Steven; Willems, Geert; De Langhe, Pascal; Vandamme, Lorenz; Allaert, K. (2000) -
Modeling 1/f noise and extraction of the SPICE noise parameters using a new extraction procedure
Van Heijningen, Marc; Vandamme, Ewout; Deferm, Ludo; Vandamme, Lorenz (1998) -
The use of integrated resistors and buried capacitance in high performance telecom printed circuit boards
Peeters, Joris; Roose, Erik; Vandamme, Lorenz; Ackaert, Ann; Allaert, K.; Van Den Torren, Luc; Martens, Luc (1996) -
Unsolved problemns on 1/f noise in MOSFETs and possible solutions
Vandamme, Ewout; Vandamme, Lorenz (1999) -
Unsolved problemns on 1/f noise in MOSFETs and possible solutions
Vandamme, Ewout; Vandamme, Lorenz (2000)