Browsing by author "Van Aert, Sandra"
Now showing items 1-10 of 10
-
Chapter Five - Optimal experiment design for nanoparticle atom counting from ADF STEM images
De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter Four - Atom counting
De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter One - Introduction
De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter Seven - Image-quality evaluation and model selection with maximum a posteriori probability
Fatermans, Jarmo; De Backer, Annick; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter Six - Atom column detection
Fatermans, Jarmo; De Backer, Annick; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter Three - Efficient fitting algorithm
De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021) -
Chapter Two - Statistical parameter estimation theory: principles and simulation studies
De Backer, Annick; Fatermans, Jarmo; den Dekker, Arnold; Van Aert, Sandra (2021) -
Single atom detection from low contrast-to-noise ratio electron microscopy images
Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, Ivan; O'Leary, C. M.; Nellist, Peter D.; Van Aert, Sandra (2018-07) -
The maximum a posteriori probability rule for atom column detection from HAADF STEM images
Fatermans, J.; Van Aert, Sandra; den Dekker, Arnold-Jan (2019-06) -
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Fatermans, J.; den dekker, Arnold Jan; Müller-Caspary, K.; Lobato, I.; Van Aert, Sandra (2018)