Single atom detection from low contrast-to-noise ratio electron microscopy images

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Authors

Fatermans, J.; den Dekker, Arnold Jan; Müller-Caspary, K.; Lobato, Ivan; O'Leary, C. M.; Nellist, Peter D.; Van Aert, Sandra

ISSN

0031-9007

Issue

5

Journal

Physical Review Letters

Volume

121

Title

Single atom detection from low contrast-to-noise ratio electron microscopy images

Publication type

Journal article

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