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Single atom detection from low contrast-to-noise ratio electron microscopy images
Publication:
Single atom detection from low contrast-to-noise ratio electron microscopy images
Date
2018-07
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den Dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, Ivan
;
O'Leary, C. M.
;
Nellist, Peter D.
;
Van Aert, Sandra
Journal
Physical Review Letters
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1871
since deposited on 2021-10-25
Acq. date: 2025-10-25
Citations
Metrics
Views
1871
since deposited on 2021-10-25
Acq. date: 2025-10-25
Citations