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Conference contributions
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Publication:
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Date
2018
Meeting abstract
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40040.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, I.
;
Van Aert, Sandra
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Abstract
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1857
since deposited on 2021-10-25
Acq. date: 2025-10-25
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1
since deposited on 2021-10-25
Acq. date: 2025-10-25
Views
1857
since deposited on 2021-10-25
Acq. date: 2025-10-25
Citations