Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Publication:
The maximum a posteriori probability rule to detect single atoms from low signal-to-noise ratio scanning transmission electron microscopy images
Copy permalink
Date
2018
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
40040.pdf
290.8 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fatermans, J.
;
den dekker, Arnold Jan
;
Müller-Caspary, K.
;
Lobato, I.
;
Van Aert, Sandra
Journal
Abstract
Description
Metrics
Downloads
1
since deposited on 2021-10-25
Acq. date: 2025-12-09
Views
1860
since deposited on 2021-10-25
Acq. date: 2025-12-09
Citations
Metrics
Downloads
1
since deposited on 2021-10-25
Acq. date: 2025-12-09
Views
1860
since deposited on 2021-10-25
Acq. date: 2025-12-09
Citations