Browsing by author "Kunert, Bernadette"
Now showing items 1-1 of 1
-
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Zhao, Simeng; jiang, Rong; Wang, Pang; Zhang, En Xia; Waldron, Niamh; Kunert, Bernadette; Mitard, Jerome; Collaert, Nadine; Soncke, Sonja; Linten, Dimitri; Schrimpf, Ronald; Reed, Robert; Fleetwood, Daniel (2018-09)