Authors

Zhao, Simeng; jiang, Rong; Wang, Pang; Zhang, En Xia; Waldron, Niamh; Kunert, Bernadette; Mitard, Jerome; Collaert, Nadine; Soncke, Sonja; Linten, Dimitri; Schrimpf, Ronald; Reed, Robert; Fleetwood, Daniel

Conference

Radiation Effects on Components and Systems - RADECS

Title

Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si

Publication type

Proceedings paper