Publication:
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
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1999 since deposited on 2021-10-26
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Acq. date: 2025-10-24
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Metrics
Views
1999 since deposited on 2021-10-26
420item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations