Publication:
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
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2007 since deposited on 2021-10-26
3last month
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Acq. date: 2026-02-26
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Statistics
Views
2007 since deposited on 2021-10-26
3last month
1last week
Acq. date: 2026-02-26
Citations