Publication:
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
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2008 since deposited on 2021-10-26
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Acq. date: 2026-08-25
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2008 since deposited on 2021-10-26
1last month
1last week
Acq. date: 2026-08-25
Citations