Publication:
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2007 since deposited on 2021-10-26
Acq. date: 2026-04-05
Citations
Statistics
Views
2007 since deposited on 2021-10-26
Acq. date: 2026-04-05
Citations