Publication:
Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si
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2003 since deposited on 2021-10-26
2last month
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Acq. date: 2026-01-09
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Views
2003 since deposited on 2021-10-26
2last month
1last week
Acq. date: 2026-01-09
Citations