Browsing by author "Alles, M. L."

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Geometry dependence of total dose effects in bulk FINFETs

Chatterjee, I; Zhang, E.X.; Buva, B. L.; Reed, Robert; Alles, M. L.; Nahatme, N. N.; BAll, D. R.; Schrimpf, R.; Fleedwood, D. M.; Mitard, Jerome; Linten, Dimitri; Simoen, Eddy; Claeys, Cor (2014)
Total ionizing dose effects on strained Ge pMOS FinFETS on bulk Si

Zhang, E. Z; Fleetwood, D. M.; Hatchel, J. A.; Liang, C.; Reed, R.; Alles, M. L.; Schrimpf, R. D.; Linten, Dimitri; Mitard, Jerome; Chisholm, M. F.; Pantelides, S. T. (2017)