Geometry dependence of total dose effects in bulk FINFETs

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Authors

Chatterjee, I; Zhang, E.X.; Buva, B. L.; Reed, Robert; Alles, M. L.; Nahatme, N. N.; BAll, D. R.; Schrimpf, R.; Fleedwood, D. M.; Mitard, Jerome; Linten, Dimitri; Simoen, Eddy; Claeys, Cor

ISSN

0018-9499

Issue

6

Journal

IEEE Transactions on Nuclear Science

Volume

61

Title

Geometry dependence of total dose effects in bulk FINFETs

Publication type

Journal article

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