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Geometry dependence of total dose effects in bulk FINFETs
Publication:
Geometry dependence of total dose effects in bulk FINFETs
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Chatterjee, I
;
Zhang, E.X.
;
Buva, B. L.
;
Reed, Robert
;
Alles, M. L.
;
Nahatme, N. N.
;
BAll, D. R.
;
Schrimpf, R.
;
Fleedwood, D. M.
;
Mitard, Jerome
;
Linten, Dimitri
;
Simoen, Eddy
;
Claeys, Cor
Journal
IEEE Transactions on Nuclear Science
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1960
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1960
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations