Browsing by author "Chu, L.K."
Now showing items 1-1 of 1
-
Low interfacial trap density and sub-nm equivalent oxide thickness in In0.53Ga0.47As (001) metal-oxide-semiconductor devices using molecular beam deposited HfO2/Al2O3 as gate dielectrics
Chu, L.K.; Merckling, Clement; Alian, AliReza; Dekoster, Johan; Kwo, J.; Hong, M.; Caymax, Matty; Heyns, Marc (2011)