Browsing by author "Luchies, J. M."
Now showing items 1-2 of 2
-
Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Verhaege, Koen; Russ, Christian; Luchies, J. M.; Groeseneken, Guido; Kuper, F. G. (1997) -
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Verhaege, Koen; Luchies, J. M.; Russ, Christian; Groeseneken, Guido; Kuper, F. (1995)