NMOS transistor behaviour under CDM stress conditions and relation to other ESD models

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Authors
Verhaege, Koen; Luchies, J. M.; Russ, Christian; Groeseneken, Guido; Kuper, F.
Conference
Proceedings of the 6th ESREF Conference
Title
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Publication type
Proceedings paper
Embargo date
9999-12-31
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