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Conference contributions
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Publication:
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Date
1995
Proceedings Paper
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971.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verhaege, Koen
;
Luchies, J. M.
;
Russ, Christian
;
Groeseneken, Guido
;
Kuper, F.
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Abstract
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1957
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
1957
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations