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Conference contributions
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
Publication:
NMOS transistor behaviour under CDM stress conditions and relation to other ESD models
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Date
1995
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verhaege, Koen
;
Luchies, J. M.
;
Russ, Christian
;
Groeseneken, Guido
;
Kuper, F.
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1960
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Acq. date: 2025-12-12
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Views
1960
since deposited on 2021-09-29
1
last month
1
last week
Acq. date: 2025-12-12
Citations