Publication:

NMOS transistor behaviour under CDM stress conditions and relation to other ESD models

Date

1995
Proceedings Paper
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dc.contributor.authorVerhaege, Koen
dc.contributor.authorLuchies, J. M.
dc.contributor.authorRuss, Christian
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorKuper, F.
dc.contributor.imecauthorGroeseneken, Guido
dc.date.accessioned2021-09-29T13:24:14Z
dc.date.available2021-09-29T13:24:14Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/992
dc.source.beginpage117
dc.source.conferenceProceedings of the 6th ESREF Conference
dc.source.conferencedate3/10/1995
dc.source.conferencelocationBordeaux France
dc.source.endpage125
dc.title

NMOS transistor behaviour under CDM stress conditions and relation to other ESD models

dc.typeProceedings paper
dspace.entity.typePublication
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