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Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Publication:
Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions
Date
1997
Journal article
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2262.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verhaege, Koen
;
Russ, Christian
;
Luchies, J. M.
;
Groeseneken, Guido
;
Kuper, F. G.
Journal
IEEE Trans. Electron Devices
Abstract
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2033
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations
Metrics
Views
2033
since deposited on 2021-09-30
Acq. date: 2025-10-24
Citations