Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions

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Authors

Verhaege, Koen; Russ, Christian; Luchies, J. M.; Groeseneken, Guido; Kuper, F. G.

Issue

11

Journal

IEEE Trans. Electron Devices

Volume

44

Title

Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions

Publication type

Journal article

Embargo date

9999-12-31

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