Browsing by author "Nguyen, Ngoc Duy"
Now showing items 1-9 of 9
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Bandgap measurement by spectroscopic ellipsometry for strained Ge 1-x Sn x
Shimura, Yosuke; Wang, Wei; Nieddu, Thomas; Gencarelli, Federica; Vincent, Benjamin; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013-06) -
Current transients in reverse-biased p-GeSn/n-Ge diodes
Baert, Bruno; Gupta, Somya; Gencarelli, Federica; Shimura, Yosuke; Loo, Roger; Simoen, Eddy; Nguyen, Ngoc Duy (2015) -
Electrical activity of threading dislocations and defect complexes in GeSn epitaxial layers
Gupta, Somya; Simoen, Eddy; Asano, Takanori; Nakatsuka, Osamu; Gencarelli, Federica; Shimura, Yosuke; Moussa, Alain; Loo, Roger; Zaima, Shigeaki; Nguyen, Ngoc Duy; Heyns, Marc (2013) -
Grain-boundary segregation of magnesium in doped cuprous oxide and impact on electrical transport properties (vol 11, 7788, 2021)
Resende, Joao; Nguyen, Van-Son; Fleischmann, Claudia; Bottiglieri, Lorenzo; Brochen, Stephane; Vandervorst, Wilfried; Favre, Wilfried; Jimenez, Carmen; Deschanvres, Jean-Luc; Nguyen, Ngoc Duy (2021) -
Integration of III-V on Si for high-mobility CMOS
Waldron, Niamh; Wang, G.; Nguyen, Ngoc Duy; Orzali, Tommaso; Merckling, Clement; Brammertz, Guy; Ong, Patrick; Winderickx, Gillis; Hellings, Geert; Eneman, Geert; Caymax, Matty; Meuris, Marc; Horiguchi, Naoto; Thean, Aaron (2012) -
Integration of InGaAs channel n-MOS devices on 200mm Si wafers using the aspect-ratio-trapping technique
Waldron, Niamh; Wang, Gang; Nguyen, Ngoc Duy; Orzali, Tommaso; Merckling, Clement; Brammertz, Guy; Ong, Patrick; Winderickx, Gillis; Hellings, Geert; Eneman, Geert; Caymax, Matty; Meuris, Marc; Horiguchi, Naoto; Thean, Aaron (2012) -
Opto-electronic properties and solar cell efficiency modelling of Cu2ZnXS4 (X = Sn, Ge, Si) kesterites
Ratz, Thomas; Raty, Jean-Yves; Brammertz, Guy; Vermang, Bart; Nguyen, Ngoc Duy (2021) -
Study of interface trap density in a GeSn MOS structure by numerical simulation of the electrical characteristics
Baert, Bruno; Gupta, Somya; Schmeits, Marcel; Simoen, Eddy; Nguyen, Ngoc Duy (2013) -
Theoretical and experimental investigation of the GeSn bandgap
Shimura, Yosuke; Wang, Wei; Gencarelli, Federica; Vincent, Benjamin; Nieddu, Thomas; Laha, Priya; Terryn, Herman; Stefanov, Stefan; Chiussi, Stefano; Van Campenhout, Joris; Nguyen, Ngoc Duy; Vantomme, Andre; Loo, Roger (2013)