Browsing by author "Mikolajick, T."
Now showing items 1-6 of 6
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Ferroelectricity in Gd:HfO2 thin films
Mueller, Stefan; Adelmann, Christoph; Singh, A.; Van Elshocht, Sven; Schroeder, Uwe; Mikolajick, T. (2012-10) -
Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)
Ferrada, Pablo; Harney, R.; Wefringhaus, E.; Doering, S.; Jakschick, S.; Mikolajick, T.; Eyben, Pierre; Hantschel, Thomas; Vandervorst, Wilfried; Weiss, M.; Lossen, J. (2013) -
Non-volatile data storage in 28nm ferroelectric FETs
Schroeder, U.; Mueller, J.; Yurchuk, E.; Mueller, S.; Martin, D.; Adelmann, Christoph; Mikolajick, T. (2012) -
Searching for the origin of the ferroelectric phase in HfO2
Schroeder, Uwe; Schenk, T.; Richter, C.; Hoffmann, M.; Martin, D.; Shimizu, T.; Funakubo, H.; Pohl, D.; Adelmann, Christoph; Materlik, R.; Kersch, A.; Sang, X.; LeBeau, J.; Kalinin, S.; Mikolajick, T. (2015) -
Stabilizing the ferroelectric phase in doped hafnium oxide
Hoffmann, M.; Schroeder, Uwe; Schenk, Tony; Shimizu, T; Funakubo, H.; Sakata, O.; Pohl, D.; Drescher, M.; Adelmann, Christoph; Materlik, R.; Kersch, A.; Mikolajick, T. (2015) -
Strontium doped hafnium oxide thin films: wide process window for ferroelectric memories
Schenk, Tony; Mueller, S.; Schroeder, Uwe; Materlik, R.; Kersch, A.; Popovici, Mihaela Ioana; Adelmann, Christoph; Van Elshocht, Sven; Mikolajick, T. (2013)