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Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)
Publication:
Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)
Date
2013
Journal article
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25426.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ferrada, Pablo
;
Harney, R.
;
Wefringhaus, E.
;
Doering, S.
;
Jakschick, S.
;
Mikolajick, T.
;
Eyben, Pierre
;
Hantschel, Thomas
;
Vandervorst, Wilfried
;
Weiss, M.
;
Lossen, J.
Journal
IEEE Journal of Photovoltaics
Abstract
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1901
since deposited on 2021-10-21
Acq. date: 2025-10-27
Citations
Metrics
Views
1901
since deposited on 2021-10-21
Acq. date: 2025-10-27
Citations