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Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)
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Local doping profiles for height-selective emitters determined by Scanning Spreading Resistance Microscopy (SSRM)
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Date
2013
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ferrada, Pablo
;
Harney, R.
;
Wefringhaus, E.
;
Doering, S.
;
Jakschick, S.
;
Mikolajick, T.
;
Eyben, Pierre
;
Hantschel, Thomas
;
Vandervorst, Wilfried
;
Weiss, M.
;
Lossen, J.
Journal
IEEE Journal of Photovoltaics
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Acq. date: 2026-04-06
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Statistics
Views
1904
since deposited on 2021-10-21
1
last month
Acq. date: 2026-04-06
Citations