Browsing by author "Kohlstedt, H."

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Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method

Girgis, E.; Boeve, Hans; De Boeck, Jo; Schelten, J.; Rottlander, P.; Kohlstedt, H.; Grünberg, P. (2000)
Statistical model for prebreakdown current jumps and breakdown caused by single traps in magnetic tunnel junctions

Das, Johan; Degraeve, Robin; Groeseneken, Guido; Stein, S.; Kohlstedt, H.; Borghs, Gustaaf; De Boeck, Jo (2003)