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Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method
Publication:
Dielectric breakdown of lithographically patterned tunnel junctions prepared by UV oxidation method
Date
2000
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Girgis, E.
;
Boeve, Hans
;
De Boeck, Jo
;
Schelten, J.
;
Rottlander, P.
;
Kohlstedt, H.
;
Grünberg, P.
Journal
Journal of Magnetism and Magnetic Materials
Abstract
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1
since deposited on 2021-10-14
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1922
since deposited on 2021-10-14
Acq. date: 2025-10-23
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Downloads
1
since deposited on 2021-10-14
Acq. date: 2025-10-23
Views
1922
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations