Browsing by author "Fujimoto, D."

Now showing items 1-2 of 2

Characterization of EM faults on ATmega328p

Beckers, Arthur; Balasch, J.; Gierlichs, B.; Verbauwhede, I.; Osuka, S.; Kinugawa, M.; Fujimoto, D.; Hayashi, Y. (2019)
EM information security threats against RO-based TRNGs: The frequency injection attack based on IEMI and EM information leakage

Osuka, S; Fujimoto, D.; Hayashi, Y.; Homma, N.; Beckers, A.; Balasch, J.; Gierlichs, B.; Verbauwhede, I. (2019)