Browsing by author "Vanbel, Maarten"
Now showing items 1-3 of 3
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Second-harmonic generation as characterization tool for Ge/passivation layer interfaces
Vanbel, Maarten; Delabie, Annelies; Sioncke, Sonja; Adelmann, Christoph; Afanasiev, Valeri; Locquet, Jean-Pierre; Van Elshocht, Sven; Caymax, Matty; Verbiest, Thierry (2012) -
SHG/2PF microscopy of single and multi-layer graphene
Klekachev, Alexander; Asselberghs, Inge; Huyghebaert, Cedric; Vanbel, Maarten; Van der Veen, Monique; Stesmans, Andre; Heyns, Marc; De Gendt, Stefan; Verbiest, Thierry (2012) -
Si passivation for Ge pMOSFETs: impact of Si cap growth conditions
Vincent, Benjamin; Loo, Roger; Vandervorst, Wilfried; Delmotte, Joris; Douhard, Bastien; Valev, Ventislav; Vanbel, Maarten; Verbiest, Thierry; Rip, Jens; Brijs, Bert; Conard, Thierry; Claypool, Chris; Takeuchi, Shotaro; Zaima, Shigeaki; Mitard, Jerome; De Jaeger, Brice; Dekoster, Johan; Caymax, Matty (2011)