Browsing by author "Hue, Florent"
Now showing items 1-3 of 3
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Strain mapping of tensile strained silicon transistors with embedded Si1yCy source and drain by dark-field holography
Hue, Florent; Hytch, Martin; Houdellier, Florent; Bender, Hugo; Claverie, Alain (2009) -
Strain measurements in electronic devices by aberration-corrected HRTEM and dark-field holography
Hue, Florent; Houdellier, F.; Snoeck, E.; Hartmann, J.P.; Destefanis, V.; Bender, Hugo; Claverie, Alain; Hytch, Martin (2008-09) -
Strain measurements in transistors by dark-field holography
Hue, Florent; Houdellier, F.; Bender, Hugo; Snoeck, E.; Hytch, M.J. (2009)