Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Strain measurements in transistors by dark-field holography
Publication:
Strain measurements in transistors by dark-field holography
Date
2009
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hue, Florent
;
Houdellier, F.
;
Bender, Hugo
;
Snoeck, E.
;
Hytch, M.J.
Journal
Abstract
Description
Metrics
Views
1870
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations
Metrics
Views
1870
since deposited on 2021-10-17
Acq. date: 2025-10-24
Citations