Browsing by author "Niehuis, Ewald"
Now showing items 1-3 of 3
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In-situ ToF-SIMS and SFM measurements of inorganic semiconductor materials
Franquet, Alexis; Spampinato, Valentina; Conard, Thierry; Mollers, Rudolf; Niehuis, Ewald; Vandervorst, Wilfried (2016) -
Sputtering with large On+ cluster projectiles on inorganic surfaces
Fleischmann, Claudia; Conard, Thierry; Franquet, Alexis; Niehuis, Ewald; Rading, Derk; Moellers, Rudolf; Poleunis, Claude; Delcorte, Arnaud; Vandervorst, Wilfried (2015) -
Surface analysis in the semiconductor industry: Present use and future possibilities
van der Heide, Paul; Spampinato, Valentina; Franquet, Alexis; Zborowski, Charlotte; Conard, Thierry; Ludwig, Jonathan; Paredis, Kristof; Vandervorst, Wilfried; Pirkl, Alexander; Niehuis, Ewald (2020)