Browsing by author "Raskin, J-P"
Now showing items 1-4 of 4
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Back-gate bias effect on UTBB-FDSOI non-linearity performance
Kazemi Esfeh, Babak; Kilchytska, Valeria; Parvais, Bertrand; Planes, Nicolas; Haond, M; Flandre, Denis; Raskin, J-P (2017) -
Comparative study of non-linearities in 28 nm node FDSOI and Bulk MOSFETs
Kilchytska, Valeria; Kazemi Esfeh, Babak; Gimeno, C.; Parvais, Bertrand; Planes, N.; Haond, M.; Raskin, J-P; Flandre, Denis (2017) -
Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates
Cardinael, P.; Rack, M.; Lederer, D.; Raskin, J-P; Yadav, Sachin; Zhao, Ming; Collaert, Nadine; Parvais, Bertrand (2021) -
Modeling the effect of charges in the back side passivation layer on through silicon via (TSV) capacitance after wafer thinning
Rack, Martin; Stucchi, Michele; Sun, Xiao; Roda Neve, Cesar; Van der Plas, Geert; Beyne, Eric; Absil, Philippe; Raskin, J-P (2015)