Browsing by author "Hetherington, C.J.D."

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FEG-TEM analysis of the effects of Ge segregation and germane flux on the Ge profile across nm-scale SiGe layers, grown by both MBE and CVD

Benedetti, Alessandro; Norris, D.J.; Hetherington, C.J.D.; Cullis, A.G.; Robbins, D.J.; Wallis, D.J. (2003)