Browsing by imec author "d762612c84fe4cea5e04a13ab162c87d6ecb445e"
Now showing items 21-23 of 23
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Testing & diagnosis of fine-pitch wafers and advanced packages
Fodor, Ferenc; Marinissen, Erik Jan; Acconcia, Daniele; Bertarelli, Emanuele; Vallauri, Raffaele (2018) -
Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements
Monta, Kazuki; Katselas, Leonidas; Fodor, Ferenc; Miki, Takuji; Hatzopoulos, Alkis; Nagata, Makoto; Marinissen, Erik Jan (2022) -
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
Monta, Kazuki; Kataselas, Leonidas; Fodor, Ferenc; Hatzopoulos, Alkis; Nagata, Makoto; Marinissen, Erik Jan (2021)