Publication:

Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring

Date

2021

Proceedings Paper

https://doi.org/10.1109/ETS50041.2021.9465391

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Author(s)

;

Kataselas, Leonidas

;

;

Hatzopoulos, Alkis

;

;

Marinissen, Erik Jan

Journal

na

Metrics

1772 since deposited on 2022-03-14

Acq. date: 2026-01-10