Publication:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
| dc.contributor.author | Monta, Kazuki | |
| dc.contributor.author | Kataselas, Leonidas | |
| dc.contributor.author | Fodor, Ferenc | |
| dc.contributor.author | Hatzopoulos, Alkis | |
| dc.contributor.author | Nagata, Makoto | |
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.imecauthor | Fodor, Ferenc | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2022-03-14T11:50:26Z | |
| dc.date.available | 2022-03-14T11:50:26Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/ETS50041.2021.9465391 | |
| dc.identifier.eisbn | 978-1-6654-1849-2 | |
| dc.identifier.issn | 1530-1877 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39443 | |
| dc.publisher | IEEE | |
| dc.source.conference | 26th IEEE European Test Symposium (ETS) | |
| dc.source.conferencedate | MAY 24-28, 2021 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.journal | na | |
| dc.source.numberofpages | 4 | |
| dc.title | Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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