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Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
Publication:
Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring
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Date
2021
Proceedings Paper
https://doi.org/10.1109/ETS50041.2021.9465391
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Monta, Kazuki
;
Kataselas, Leonidas
;
Fodor, Ferenc
;
Hatzopoulos, Alkis
;
Nagata, Makoto
;
Marinissen, Erik Jan
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na
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1772
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Acq. date: 2025-12-11
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Views
1772
since deposited on 2022-03-14
1
last month
1
last week
Acq. date: 2025-12-11
Citations